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5962-01-062-4606, 5962010624606 NSN Information

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Manufacturer Part Number(s):50-800139-1, F93417DM, M38510/20301BEA, ROM/PROM FAMILY 021

FSC NIIN ITEM NAME
5962 010624606 MICROCIRCUIT,MEMORY
INC ESDC HMIC
4101 B N

5962-01-062-4606 MCRD (Master Cross Reference Data)

Mfg. Part # Mfg. Name CAGE RNCC RNVC ISC MSDS SADC DAC HCC
50-800139-1 GOULD INC DEFENSE SYSTEMS 53613 3 9 2
F93417DM FAIRCHILD SEMICONDUCTOR CORP 07263 5 1 2
M38510/20301BEA MILITARY SPECIFICATIONS 81349 5 1 2
ROM/PROM FAMILY 021 DLA LAND AND MARITIME 16236 5 1 2

5962-01-062-4606 Characteristics

MRC Requirement Statement Characteristics
ADAQ BODY LENGTH 0.840 INCHES MAXIMUM
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
TTQY TERMINAL TYPE AND QUANTITY 16 PRINTED CIRCUIT
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE AND SCHOTTKY AND HIGH SPEED AND BIPOLAR AND W/ENABLE
CWSG TERMINAL SURFACE TREATMENT SOLDER
AEHX MAXIMUM POWER DISSIPATION RATING 739.0 MILLIWATTS
CZEQ TIME RATING PER CHACTERISTIC 75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CTFT CASE OUTLINE SOURCE AND DESIGNATOR D-2 MIL-M-38510
AFGA OPERATING TEMP RANGE -55.0 TO 125.0 DEG CELSIUS
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
ADAT BODY WIDTH 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
AFJQ STORAGE TEMP RANGE -65.0 TO 150.0 DEG CELSIUS
CQZP INPUT CIRCUIT PATTERN 10 INPUT
CRHL (NON-CORE DATA) BIT QUANTITY 1024
ADAU BODY HEIGHT 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM
CSWJ (NON-CORE DATA) WORD QUANTITY 256
CZER MEMORY DEVICE TYPE ROM