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5962-01-057-7050, 5962010577050 NSN Information

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Manufacturer Part Number(s):27030700820, 54S20DMQB, 9S20DMQB, DM54S20J/883, ES5629-02, S54S20F/883B

FSC NIIN ITEM NAME
5962 010577050 MICROCIRCUIT,DIGITAL
INC ESDC HMIC
3177 B N

5962-01-057-7050 MCRD (Master Cross Reference Data)

Mfg. Part # Mfg. Name CAGE RNCC RNVC ISC MSDS SADC DAC HCC
27030700820 SAPA OPERACIONES S.L. 0124B 5 2 C
54S20DMQB FAIRCHILD SEMICONDUCTOR CORP 07263 5 9 C
9S20DMQB FAIRCHILD SEMICONDUCTOR CORP 07263 5 9 C
DM54S20J/883 NATIONAL SEMICONDUCTOR CORPORATION 27014 5 9 C
ES5629-02 DRS SUSTAINMENT SYSTEMS INC. 20418 1 2 C
S54S20F/883B PHILIPS SEMICONDUCTORS INC 18324 3 2 C

5962-01-057-7050 Characteristics

MRC Requirement Statement Characteristics
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
CSSL DESIGN FUNCTION AND QUANTITY 2 GATE, NAND
SR-1 MANUFACTURERS CODE 20418
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
SR-1 SPEC/STD CONTROLLING DATA
CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT
ADAU BODY HEIGHT 0.185 INCHES NOMINAL
CZEQ TIME RATING PER CHACTERISTIC 4.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 5.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS
CQSJ INCLOSURE MATERIAL CERAMIC
AFGA OPERATING TEMP RANGE -55.0 TO 125.0 DEG CELSIUS
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
ABKW III OVERALL HEIGHT 0.300 INCHES MINIMUM AND 0.365 INCHES MAXIMUM
SR-1 MFR SOURCE CONTROLLING REFERENCE ES5629-02
AFJQ STORAGE TEMP RANGE -65.0 TO 150.0 DEG CELSIUS
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM TOTAL SUPPLY
ADAQ BODY LENGTH 0.750 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
ADAT BODY WIDTH 0.245 INCHES MINIMUM AND 0.271 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 14 PRINTED CIRCUIT